Sources
| Source | ID | Link | Books | Overlap |
|---|---|---|---|---|
| GoodReads | 1006983 | not fetched yet | 11 | 11 (100%) |
| Amazon | no author ID (search by name) | https://www.amazon.com/s?i=stripbooks&rh=p_27%3ADavid%20G.%20Seiler | 11 | 11 (100%) |
Most recent book on record
Metrology and Diagnostic Techniques for Nanoelectronics
Date: 2016-10-03